Preface for Procedings of The 10th International Symposium on Atomic Level Characterization for New Materials and Devices (ALC '15)
The 10th International Symposium “Atomic Level Characterization for New Materials and Devices (ALC '15)” under the auspices of the 141st Committee on Microbeam Analysis of the Japan Society for the Promotion of Science (JSPS) was held in Matsue city, Japan, gathering more than 250 participants from 16 countries. The 141st Committee, one of 68 Industry cooperative research committees organized by the JSPS, was established in September 1974 to meet the growing demands of microbeam analysts, users and scientists for further education, innovation and mutual cooperation among industries, governmental institutes and universities. This committee has several goals; developing new methodologies, technologies and microanalysis instrumentation; promoting widely the practical application of these up-to-date technologies to industry; and in particular, encouraging scientists of the next generation in the field of microanalysis.
JSPS-141st Committee on Microbeam Analysis is also the national representative of Japan in IUMAS (International Union of Microbeam Analysis Societies). Hosting of this kind of International symposium, aiming at dissemination and exchange of new achievements, raising young researchers in this field is one of our missions.
The series of international symposia on ALC has been held basically biennially, started in 1996, the first being held in Kyoto, followed by the second in Maui, Hawaii, 1997, the third in Nara, 2001, the fourth in Kauai, Hawaii, 2003, the fifth in the Big Island, Hawaii, 2005, the 6th in Kanazawa, 2007, the 7th in Maui, Hawaii, 2009, the 8th in conjunction with IUMAS-5 in Seoul, Korea, 2011, and the 9th in the Big Island, Hawaii. The ALC is the most active meeting organization in Japan and probably in the world, to promote the science and technology related to microbeam analysis and characterization of materials at the nanometer scale.
The symposium is aimed at establishing the atomic level characterization as the key technology for nanotechnology which has been the focus of much research effort and development in many countries recently. The symposium features the significant approaches towards atomic leve1 characterization and its applications to a variety of fields such as materials science, mineralogy, geology, energy storage, cosmology, biology and medical examination and treatment.
It is very honorable to give our best award, the JSPS 141st Committee Award, to the distinguished scientists from around the world. This time, we celebrated Prof. David B. Williams, The Ohio State University, USA, as the laureate. It was also our great pleasure to invite Professor Hiroshi Amano, Nobel Prize laureate in Physics 2014, as special lecturer in a plenary session.
Special thanks to our committee members, Prof. Y. Takai, the chair of the steering committee, Prof. H. Hibino, the chair of the program committee. Thanks also to Dr. T. Nagatomi who carried out most of the practical work of the ALC organization as the secretary. Most of the publication matters have been handled by Prof. M. Suzuki, the chair of publication committee. We also have to give big thanks to Mr. K. Miyazaki, who contributed much energy for the fund raising from companies as the chair of the finance committee. We also express special thanks to Dr. R. Oiwa, Prof. H. Nakahara, Dr. T. Sato, Prof. S. Aoyagi, Prof. F. Matsui, Prof. T. Hayasaka, and Prof. M. Nojima for their great contribution to the success of the symposium.
Lastly, we express our deep appreciation to the financial supports by Japan Society for the Promotion of Science (JSPS), JSPS University-Industry Research Corporation, Electric Technology Research Foundation of Chugoku, Research Foundation for the Electrotechnology of Chubu, The Naito Foundation, Shimane Prefecture, and Matsue City.
Yahachi Saito
The chair of JSPS-141st Committee on Microbeam Analysis
Department of Quantum Engineering, Nagoya University
Motofumi Suzuki
The chair of Publication Committee
Department of Micro Engineering, Kyoto University