ALC ’15
October 25 (Sun) – 30 (Fri), 2015
Kunibiki Messe, Matsue, Shimane, JAPAN
(Current date/time: October 12, 2018 / 14:01 JST)
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Manuscripts for Reviewed JournalsSelected papers will be considered for publication in a special issue of “Surface and Interface Analysis” (SIA; Wiley) or “e-Journal of Surface Science and Nanotechnology” (e-JSSNT; SSSJ).
Authors can submit the same contents as the proceedings, however, submission format should follow respective instructions of journals which you want to submit. SIA/e-JSSNT Deadline
How to Prepare a ManuscriptPrepare your manuscript according to SIA or e-JSSNT instructions depending on which journal you want to submit to. How to Submit a ManuscriptSubmit a Manuscript for SIAReviewing process for the special issue of SIA is different from a normal one. You should submit the manuscript to the publication committee of this symposium via this web page but NOT the Wiley web site. The manuscript can be prepared by Microsoft Word or LaTeX. Read the following cautions for Word and LaTeX users before you submit a manuscript.
To submit your manuscript, put your application ID (the ID number which was given upon application) and the registered e-mail, then click on a [Initial Submission for SIA] button below. Results of the reviewing process will be sent to you by e-mail from one of editors. A revised version of your manuscript, reply to the referee and comments to the editor should be sent by an e-mail directly to the relevant editor. His/her e-mail address will be informed to you with the results of the reviwing process. If you have any questions or query of your paper status, send e-mail to the editorial board (the address is shown below).
You will be requested to upload all source files when the reviewing process is finished. Details will be notified via an e-mail from the publication committee. Submit a Manuscript for e-JSSNT
All reviewing and publication processes will be conformed with e-JSSNT procedure. Please follow the instructions written in the e-JSSNT web site. |
Host Organization: The 141st Committee on Microbeam Analysis, JSPS Joint Sponsor: The Surface Science Society of Japan |