The Japan Society of Vacuum and Surface ScienceI S S N : 1348-0391
Preface to Proceedings of The 6th NSS
Yoshio Watanabe
Chair of the Organizing Committee of NSS6
Application of a Modulating Technique to Detect Near-Field Signals Using a Conventional IR Spectrometer with a Ceramic Light Source
Michio Ishikawa et al.
Chemical State Analysis of Si-Doped CNT on SiC by Hard X-Ray Photoelectron Spectroscopy
Jin-Young Son et al.
Evaluation of Few-Layer Graphene Grown by Gas-Source Molecular Beam Epitaxy Using Cracked Ethanol
Fumihiko Maeda et al.
Near-Field Spectroscopy with Infrared Synchrotron Radiation Source
Yuka Ikemoto et al.
Effect of Antiferromagnetic Anisotropy on Exchange Bias in a Single Composite Nanoparticle with Unconventional Antiferromagnetic-Ferromagnetic Core-Shell Morphology
Yong Hu et al.
Spectromicroscopy with Low-Energy Electrons: LEEM and XPEEM Studies at the Nanoscale
Tevfik Onur Mentes et al.
Observation of a 3D Network Nano-Structure of Carbon Nanotubes Scaffold for Cultivation
Shigeaki Abe et al.
Modeling of Electron Beam Charging of an Insulating Layer on a Silicon Substrate
Kaoru Ohya and Hideaki Kuwada
Exchange Bias in a Granular System of Antiferromagnetic Nanoparticles with Strong Magnetic Anisotropy Embedded in a Ferromagnetic Matrix
Relationship Between Resistance Modulation and Magnetoelectric Direction in Cr2O3/ultrathin (La,Sr)MnO3 Heterostructure
Shinya Kito et al.
Scanning Photoelectron Microscopy: a Powerful Technique for Probing Micro and Nano-Structures
Majid Kazemian Abyaneh et al.
Chemical Modification of Solid Surfaces at Nano-level by Water Cluster Ion Irradiation
Gikan H. Takaoka et al.
Surface Processing by Polyatomic Cluster Ion Beams
Passive Near-Field Microscopy in Long-Wavelength Infrared
Yusuke Kajihara et al.
Electron Microscopic Observations of Field Emission from a Carbon Film Composed of Graphite Sticks
Shozo Kono et al.
Toward Terahertz ESR Spectroscopy Using a Microcantilever
Eiji Ohmichi et al.
In-situ Observation of Nitriding Processes of Deposited-Ti Thin Films due to Ion Implantation in an Analytical Transmission Electron Microscope
Y. Kasukabe et al.
Nano-Scale Characterization of Poly-Si Gate on High-k Gate Stack Structures by Scanning Photoemission Microscopy
S. Toyoda et al.
Modification of Magnetic Stability of Co Single Atoms on Pt(111) by Dimer Formation
T. Miyamachi et al.
Modification of HOPG Surface on Irradiation by Highly Charged Ar11+ and Xe26+ Ions Investigated by SEM, ESR, SQUID, and Raman Measurements
Shengjin Liu et al.
AFM Tip Characterizer fabricated by Si/SiO2 multilayers
Hisataka Takenaka et al.
↑