Preface to the Proceedings of the 13th International Conference on Non-contact Atomic Force Microscopy (NC-AFM 2010)

Toyoko Arai

Chair of the Organizing Committee of NC-AFM 2010

Vol. 9, pp. 6-14 (2011)

Polarized Tips or Surfaces: Consequences in Kelvin Probe Force Microscopy

T. Hynninen et al.

Vol. 9, pp. 15-20 (2011)

Reconstitution and AFM Observation of Photosynthetic Membrane Protein Assembly in Planar Lipid Bilayers

Ayumi Sumino et al.

Vol. 9, pp. 21-25 (2011)

Energy Dissipation in Dynamic Force Spectroscopy of PTCDA on Ag-Si(111) √3×√3

Dennis van Vörden et al.

Vol. 9, pp. 26-29 (2011)

Dynamic Force Microscopy Study on Si(111)√3×√3-Ag Using a Tuning Fork Atomic Force Microscope

Manfred Lange et al.

Vol. 9, pp. 30-33 (2011)

Pressure Dependence of the Q-factor of Cantilevers Used for NC-AFM

Jannis Lübbe et al.

Vol. 9, pp. 117-121 (2011)

Electrostatic Potential Fluctuations on Oxide-Passivated Si(111) Surfaces Measured Using Integrated Scanning Probe Microscopy

Leonid Bolotov et al.

Vol. 9, pp. 122-125 (2011)

Step-In Mode NC-AFM Using a Quadrature Frequency Demodulator for Observing High-Aspect Ratio Structures in Air

Sumio Hosaka et al.

Vol. 9, pp. 146-152 (2011)

Highly Sensitive Electrostatic Force Detection Using Small Amplitude Frequency-Modulation Atomic Force Microscopy in the Second Flexural Mode

Keisuke Nishi et al.

Vol. 9, pp. 206-209 (2011)

Force on a Conducting Tip near a Metallic Surface Coated with a Polarizable Dielectric Layer: Theory and Experiment

Kalyani S. Date et al.

Vol. 9, pp. 210-214 (2011)

Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy

Masanao Ito et al.

Vol. 9, pp. 228-233 (2011)

Wavelet Transforms to Probe the Torsional Modes of a Thermally Excited Cantilever across the Jump-to-Contact Transition: Preliminary Results

Giovanna Malegori and Gabriele Ferrini