Preface for the proceeding of ALC '07

Takanori Koshikawa

Chair, JSPS-141st Committee on Microbeam Analysis and ALC'07

Vol. 6, pp. 25-28 (2008)

Electron Emission Characteristics of Au-covered Tungsten <111> Nanotips

K. Nomura et al.

Vol. 6, pp. 29-34 (2008)

Direction-Free Magnetic Field Application System

Ken Harada et al.

Vol. 6, pp. 35-37 (2008)

Oxide thickness measurement by scanning electron microscopy with controlling ultra-low voltage

Masayasu Nagoshi et al.

Vol. 6, pp. 38-40 (2008)

SAXS and XAFS Characterization of Nano-Scale Precipitates in Copper-Base Alloys

Yohei Takahashi et al.

Vol. 6, pp. 41-44 (2008)

Study of Graphite Nanofibers by the Scanning Atom Probe

Masahiro Taniguchi et al.

Vol. 6, pp. 45-48 (2008)

Al-Induced One Dimensional Nano-Facet Formation on Si(113) Surface

Masashi Mino et al.

Vol. 6, pp. 49-53 (2008)

Atomic-scale Structure and Morphology of γ-FeOOH Particles Formed during Corrosion of Fe-based Alloys in Aqueous Solution

Katsuya Inoue et al.

Vol. 6, pp. 54-59 (2008)

Electron Emission from Insulators Irradiated by Slow Highly Charged Ions

Walter Meissl et al.

Vol. 6, pp. 60-63 (2008)

Influence of Anion Coexistence on Crystal Structure of Iron Oxides Deposited from Steel Surfaces

Kozo Shinoda et al.

Vol. 6, pp. 64-67 (2008)

Fluctuations of Field Emission Currents under Extreme High Vacuum

B. Cho et al.

Vol. 6, pp. 68-71 (2008)

A Single-Atom Electron Source in Practical Gun of an Extreme High Vacuum

Tomohiro Urata et al.

Vol. 6, pp. 84-86 (2008)

Structural Analysis of the Si(111)√21×√21-(Ag, Au) Surface by Reflection High-Energy Electron Diffraction Patterns

Nozomi Kido and Ayahiko Ichimiya

Vol. 6, pp. 87-90 (2008)

Structural Analysis of Crystal Surfaces by Reflection High-Energy Electron Diffraction Patterns: The Si(111)7×7 Surface

Tomoko Minami et al.

Vol. 6, pp. 91-95 (2008)

Numerical Study of Space Charge Effects in a Point Cathode Electron Gun: Distribution of Space Charge Density

Ryo Iiyoshi

Vol. 6, pp. 107-110 (2008)

Thickness Determination of Graphene Layers Formed on SiC using Low-Energy Electron Microscopy

H. Hibino et al.

Vol. 6, pp. 111-114 (2008)

Development of Stage-scanning System for Confocal Scanning Transmission Electron Microscopy

Ayako Hashimoto et al.