Preface for the proceeding of ALC '03

Takanori Koshikawa

Chairperson of the Organizing Committee, ALC'03 and Vice-Chairperson, JSPS 141 Committee

Yoshikazu Homma

Chairperson of the Publication Committee, ALC’03

Vol. 1, pp. 102-105 (2003)

Toward Single Atom Chemical Analysis with STM

Tien T. Tsong

Vol. 1, pp. 106-110 (2003)

Atomic level characterization as applied to developing cathodes of high brightness

R. Shimizu

Vol. 1, pp. 111-115 (2003)

Calculation of Electron-Induced X-ray Intensities under Grazing Exit Conditions

Kouichi Tsuji et al.

Vol. 1, pp. 116-119 (2003)

Characterization of high-k materials for the advancement of high-speed ULSIs

Akira Nishiyama et al.

Vol. 1, pp. 124-129 (2003)

Growth Morphologies and Defect Structure in Hexagonal Boron Nitride Films on Ni(111): A Combined STM and XPD Study

J. Osterwalder et al.

Vol. 1, pp. 130-141 (2003)

Improving the Sensitivity of Electron Beam Microanalytical Techniques by Enhanced X-ray Spectrometry: X-ray Microcalorimetry, Silicon Drift Detector Energy Dispersive X-ray Spectrometry, and Polycapillary X-ray Optics

Dale E. Newbury

Vol. 1, pp. 142-146 (2003)

Fabrication of 1D metal nanostructures on a vicinal Au(111) surface

Susumu Shiraki et al.

Vol. 1, pp. 147-151 (2003)

Numerical analysis of space charge in a point cathode thermionic emission gun

Ryo Iiyoshi

Vol. 1, pp. 152-157 (2003)

Top Most Surface Studies by Total Reflection Positron Diffraction

A. Kawasuso et al.

Vol. 1, pp. 158-170 (2003)

Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method

Seizo Morita et al.

Vol. 1, pp. 171-174 (2003)

Slow Highly Charged Ions —A New Tool For Surface Nanostructuring?—

Friedrich Aumayr and Hannspeter Winter

Vol. 1, pp. 175-180 (2003)

Numerical Evidence of Nano-scale One-dimensional Conservative System with GOE-type Quantum Level Statistics

Mitsuyoshi Tomiya et al.

Vol. 2, pp. 1-7 (2004)

Chemical Specific Imaging and Spectroscopy of Interfaces and Dynamic Surface Processes with Synchrotron-Based X-ray Microscopy

Maya Kiskinova

Vol. 2, pp. 8-16 (2004)

Observations of Graphitized SiC Surfaces by STM

Yoshiyuki Hisada et al.

Vol. 2, pp. 17-23 (2004)

1-MV Field Emission Electron Microscope and Its Applications

Akira Tonomura

Vol. 2, pp. 24-27 (2004)

Sub-nm depth resolution in sputter depth profiling by low energy ion bombardment

Hyung-Ik Lee et al.

Vol. 2, pp. 45-51 (2004)

Structural Analysis of Coal Fly Ash Particles by means of Focused-Ion-Beam Time-of-Flight Mass Spectrometry

Tetsuo Sakamoto et al.

Vol. 2, pp. 52-55 (2004)

50 years of electron biprism —50 years of exciting electron physics—

Hannes Lichte

Vol. 2, pp. 81-88 (2004)

Transmission and Reflection Holography at Low Energies

David C. Joy and Bernhard G. Frost

Vol. 2, pp. 93-98 (2004)

Scattering and recoiling mapping of the Kr-Pt(111) and Ne-Ni(111) systems by SARIS

I. L. Bolotin et al.

Vol. 2, pp. 106-118 (2004)

Sum Frequency Generation Vibrational Spectroscopy Characterization of Surface Monolayers: Catalytic Reaction Intermediates and Polymer Surfaces

Gabor A. Somorjai et al.

Vol. 2, pp. 119-124 (2004)

Off -Axis Electron Holography for 2D Dopant Profiling of Ultra-Shallow Junctions

Bernhard G. Frost et al.

Vol. 2, pp. 125-130 (2004)

Stability of Atom-sized Metal Contacts under High Biases

Akihiro Fujii et al.

Vol. 2, pp. 131-135 (2004)

Nano-dimensional analysis for practical materials using the nano-beam SIMS apparatus

M. Nojima et al.

Vol. 2, pp. 136-140 (2004)

Differences in two-dimensional crystal structures: Racemic and enantiopure heptahelicene on Cu(111)

Karl-Heinz Ernst et al.