ALC '19 October 20 (Sun) – 25 (Fri), 2019 Miyako Messe, Kyoto JAPAN in conjunction with SIMS XXII

Scientific Topics

The sessions will cover the following topics:

1. Fundamental Phenomena
   • electron/ion/photon -solid interactions
   • emission phenomena of light, electrons, and ions
2. Characterization by Electrons / Ions / Infrared / Ultraviolet / X-rays
   • AES / XPS / XPED / EPMA / ISS / MEIS / RBS / SIMS / IR / etc.
3. Imaging Techniques
   • TEM / STEM / AEM / SEM / SAM / REM / LEEM / PEEM
   • SPM / FIM / TOF-SIMS / optical molecular imaging / ultrafast imaging / etc.
4. Applications for Nanotechnology
   • nanowires / nanotubes / nanoparticles / graphene and 2D materials
   • solid-solid / solid-liquid interfaces
5. Advanced Materials Characterization
   • spintronics materials
   • environmental and advanced energy materials
   • cosmic and terrestrial materials
6. Special Sessions
   • Characterization of water on materials surface
   • Materials informatics and machine learning
   • Operando spectroscopy and ambient pressure measurements
   • Advanced biological and medical characterization (jointly-organized with SIMS XXII)
7. Tutorials

Sponsored by the 141st Committee on Microbeam Analysis, JSPS
Current time: 2020-12-24 12:39:34 JST