About the Secondary Electron Database

This database is the collection of secondary electron spectra which have been acquired over many years by Dr. Keisuke Goto by using the absolute Auger spectrometer^* developed by himself. When he was working for the Research Institute of Instrumentation Frontier of National Institute of Advanced Industrial Science and Technology, these spectra was compiled into the database under consignment from the 141 Committee on Microbeam Analysis, the Japan Society for the Promotion of Science.

This database contains data on secondary electron spectra and secondary electron yields from more than 100 kinds of materials. Examples of the sample selection screen, spectrum display screen, and secondary electron yield graph screen of this database are shown below (click to enlarge).

^*References to the absolute Auger spectrometer and related measurements

1. K. Goto, “Standard Auger spectra taken with standard CMA”, J. Surf. Anal. 1, 162-165 (1995).
2. K. Goto and Y. Takeuchi, “Absolute Auger Electron Spectra Obtained bya Novel Cylindrical Mirror Analyzer”, J. Surf. Sci. Soc. Jpn. 17, 417-422, (1996).
3. K. Goto and Y. Takeuchi, “Carbon reference Auger electron spectra measured with a high‐performance cylindrical mirror analyzer”, J. Vac. Sci. Technol. A 14(3), 1408-1414 (1996).
4. K. Goto, “Reference Electron Energy Spectra for Quantitative Auger Electron Spectroscopy (AES): Cu(100), (110), and (111)”, Microsc. Microanl. 3, 1067-1068 (1997).
5. K. Goto, H. Iwata and Y. Sakai, “Measurements of Absolute Auger Electron Yield (I) —A New Design of CMA—”, J. Vac. Soc. Jpn. 31, 906-912 (1988).

Terms and Conditions

When using this secondary electron database, please agree to all the following items and comply with the contents.

• It is prohibited to copy, reprint, or distribute a part or all of the contents of this database without permission.
• It is prohibited to comprehensively download and retain this database.
• Please indicate the URL to this page (https://www.jvss.jp/division/mba/sedb/) as a reference when publishing the results obtained by using this database.
• The access log for this database is recorded on the server. This is for the purpose of understanding the database utilization status and suppressing comprehensive downloads, and logs will not be used for other purposes.
• This database is provided as academic reference material. We do not guarantee that all content is accurate or error free. Therefore, the author and provider of this database do not take any responsibility for any damage caused by using this database.

How to Access to the Database

Access to this database is free of charge. However, you must register your information prior to use the database. It is considered that you have agreed to the terms of use by registering.

• Enter your account (must be a valid e-mail), name (no nickname allowed), affiliation, and password to the following fields, check the agree checkbox and press [Send a Link to the Database] button.
• Password length is limited to 20 letters.
• A URL to the database will be sent to the specified address within few minutes.
• The URL is valid for 8 hours only. You can request another URL if it expires.
• The account (e-mail) and password you registered are required to access to the URL. Do not forget the password you entered.

Contact Info

If you have some questions or comments on this database, please contact to the secretariat of the Division of Microbeam Analysis, JVSS (mbajvss.jp).